New color sensor concept based on single spectral tunable photodiode. - Andre Wachowiak; Stefan Slesazeck; Paul Jordan; Jürgen Holz; Thomas Mikolajick (ESSDERC, 2013)

Scanning spreading resistance microscopy for failure analysis of nLDMOS devices with decreased breakdown voltage. - Stefan Doering; Ralf Rudolf; Martin Pinkert; Hagen Roetz; Catejan Wagner; Stefan Eckl; Marc Strasser; Andre Wachowiak; Thomas Mikolajick (Microelectron. Reliab., 2014)

Extraction of the active acceptor concentration in (pseudo-) vertical GaN MOSFETs using the body-bias effect. - Raoul Hentschel; Andre Wachowiak; A. Großer; Simon Kotzea; A. Debald; Holger Kalisch; Andrei Vescan; A. Jahn; Stefan Schmult; Thomas Mikolajick (Microelectron. J., 2019)

Integration and Reliability Aspects of Low-Temperature and Au-free Ta/Al-based Ohmic Contacts for AlGaN/GaN MIS-HEMTs. - Anthony Calzolaro; Thomas Mikolajick; Andre Wachowiak (ESSDERC, 2021)