An industrial experience in the built-in self test of embedded RAMs. - Paolo Camurati; Paolo Prinetto; Matteo Sonza Reorda; Stefano Barbagallo; Andrea Burri; Davide Medina (VTS, 1994)

Industrial BIST of Embedded RAMs. - Paolo Camurati; Paolo Prinetto; Matteo Sonza Reorda; Stefano Barbagallo; Andrea Burri; Davide Medina (IEEE Des. Test Comput., 1995)