Error Injecting Circuit: An Alternative to Discrete Gaussian Samplers. - Andrea Marenco; Emanuele Valea; Elena-Ioana Vatajelu (DDECS, 2026)

Back-Gate Voltage Scaling for Error Generation in LPPN on 22-nm FD-SOI Technology. - Andrea Marenco; Mathieu Leconte; Emanuele Valea; Romain Wacquez (IEEE Trans. Very Large Scale Integr. Syst., 2026)