Applying the fWLR concept to Stress induced leakage current in non-volatile memory processes. - Guoqiao Tao; Andrea Scarpa; Leo van Marwijk; Kitty van Dijk; Fred G. Kuper (Microelectron. Reliab., 2004)

Characterization and modeling of depletion-type nMOS transistors for RF switches with zero power consumption in ON-state. - Cristian Andrei; Denis Raoulx; Guy Imbert; Bart Hovens; Andrea Scarpa (ICICDT, 2013)