A unified look at the use of successive differentiation and integration in MOSFET model parameter extraction. - Francisco J. García-Sánchez; Adelmo Ortiz-Conde; Juan Muci; Andrea Sucre-González; Juin J. Liou (Microelectron. Reliab., 2015)

A review of DC extraction methods for MOSFET series resistance and mobility degradation model parameters. - Adelmo Ortiz-Conde; Andrea Sucre-González; Fabián Zárate-Rincón; Reydezel Torres-Torres; Roberto S. Murphy-Arteaga; Juin J. Liou; Francisco J. García-Sánchez (Microelectron. Reliab., 2017)