Numerical evaluation of miniaturized resistive probe for quantitative thermal near-field microscopy of thermal conductivity. - Andreas Altes; Rainer Tilgner; W. Walter (Microelectron. Reliab., 2006)

Advanced thermal failure analysis and reliability investigations - Industrial demands and related limitations. - Andreas Altes; Rainer Tilgner; Markus Reissner; Grazyna Steckert; Gerald Neumann (Microelectron. Reliab., 2008)

Scanning Microwave Microscopy for Electronic Device Analysis on Nanometre Scale. - Sören Hommel; Nicole Killat; Andreas Altes; Thomas Schweinböck; Doris Schmitt-Landsiedel; Marco Silvestri; Oliver Haeberlen (Microelectron. Reliab., 2016)