Testing of IP Services & Applications in a Service Provider Environment. - Andreas Gehring (TestCom, 2002)

Improving SiC lateral DMOSFET reliability under high field stress. - Tesfaye Ayalew; Andreas Gehring; Jong Mun Park; Tibor Grasser; Siegfried Selberherr (Microelectron. Reliab., 2003)

Modeling of retention time degradation due to inelastic trap-assisted tunneling in EEPROM devices. - Andreas Gehring; Francisco Jimenez-Molinos; Hans Kosina; A. Palma; F. Gámiz; Siegfried Selberherr (Microelectron. Reliab., 2003)

Enhancement of breakdown voltage for Ni-SiC Schottky diodes utilizing field plate edge termination. - Tesfaye Ayalew; Andreas Gehring; Tibor Grasser; Siegfried Selberherr (Microelectron. Reliab., 2004)

Statistical simulation of gate dielectric wearout, leakage, and breakdown. - Andreas Gehring; Siegfried Selberherr (Microelectron. Reliab., 2004)

Efficient Calculation of Quasi-bound States for the Simulation of Direct Tunneling. - Markus Karner; Andreas Gehring; Stefan Holzer; Hans Kosina (LSSC, 2005)

VSP - A gate stack analyzer. - Markus Karner; Andreas Gehring; M. Wagner; Robert Entner; Stefan Holzer; Wolfgang Goes; M. Vasicek; Tibor Grasser; Hans Kosina; Siegfried Selberherr (Microelectron. Reliab., 2007)