PASSAT: Efficient SAT-Based Test Pattern Generation for Industrial Circuits. - Junhao Shi; Görschwin Fey; Rolf Drechsler; Andreas Glowatz; Friedrich Hapke; Jürgen Schlöffel (ISVLSI, 2005)

Fault detection and diagnosis with parity trees for space compaction of test responses. - Harald P. E. Vranken; Sandeep Kumar Goel; Andreas Glowatz; Jürgen Schlöffel; Friedrich Hapke (DAC, 2006)

Computation and Application of Absolute Dominators in Industrial Designs. - Rene Krenz-Baath; Andreas Glowatz; Jürgen Schlöffel (ETS, 2007)

Experimental Studies on SAT-Based ATPG for Gate Delay Faults. - Stephan Eggersglüß; Daniel Tille; Görschwin Fey; Rolf Drechsler; Andreas Glowatz; Friedrich Hapke; Jürgen Schlöffel (ISMVL, 2007)

Embedded multi-detect ATPG and Its Effect on the Detection of Unmodeled Defects. - Jeroen Geuzebroek; Erik Jan Marinissen; Ananta K. Majhi; Andreas Glowatz; Friedrich Hapke (ITC, 2007)

Programmable deterministic Built-In Self-Test. - Abdul Wahid Hakmi; Hans-Joachim Wunderlich; Christian G. Zoellin; Andreas Glowatz; Friedrich Hapke; Jürgen Schlöffel; Laurent Souef (ITC, 2007)

Combining Multi-Valued Logics in SAT-based ATPG for Path Delay Faults. - Stephan Eggersglüß; Görschwin Fey; Rolf Drechsler; Andreas Glowatz; Friedrich Hapke; Jürgen Schlöffel (MEMOCODE, 2007)

On Acceleration of SAT-Based ATPG for Industrial Designs. - Rolf Drechsler; Stephan Eggersglüß; Görschwin Fey; Andreas Glowatz; Friedrich Hapke; Jürgen Schlöffel; Daniel Tille (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2008)

Defect-oriented cell-aware ATPG and fault simulation for industrial cell libraries and designs. - Friedrich Hapke; Rene Krenz-Baath; Andreas Glowatz; Jürgen Schlöffel; Hamidreza Hashempour; Stefan Eichenberger; Camelia Hora; Dan Adolfsson (ITC, 2009)

Using a two-dimensional fault list for compact Automatic Test Pattern Generation. - Marc Messing; Andreas Glowatz; Friedrich Hapke; Rolf Drechsler (LATW, 2009)

Restrict Encoding for Mixed-Mode BIST. - Abdul Wahid Hakmi; Stefan Holst; Hans-Joachim Wunderlich; Jürgen Schlöffel; Friedrich Hapke; Andreas Glowatz (VTS, 2009)

Defect-oriented cell-internal testing. - Friedrich Hapke; Wilfried Redemund; Jürgen Schlöffel; Rene Krenz-Baath; Andreas Glowatz; Michael Wittke; Hamidreza Hashempour; Stefan Eichenberger (ITC, 2010)

MONSOON: SAT-Based ATPG for Path Delay Faults Using Multiple-Valued Logics. - Stephan Eggersglüß; Görschwin Fey; Andreas Glowatz; Friedrich Hapke; Jürgen Schlöffel; Rolf Drechsler (J. Electron. Test., 2010)

Cell-aware analysis for small-delay effects and production test results from different fault models. - Friedrich Hapke; Jürgen Schlöffel; Wilfried Redemund; Andreas Glowatz; Janusz Rajski; Michael Reese; J. Rearick; Jason Rivers (ITC, 2011)

A new SAT-based ATPG for generating highly compacted test sets. - Stephan Eggersglüß; Rene Krenz-Baath; Andreas Glowatz; Friedrich Hapke; Rolf Drechsler (DDECS, 2012)

Robust Evaluation of Weighted Random Logic BIST Structures in Industrial Designs. - Rene Krenz-Baath; Friedrich Hapke; Rolf Hinze; Reinhard Meier; Maija Ryynaenen; Andreas Glowatz (DSD, 2012)

Cell-aware Production test results from a 32-nm notebook processor. - Friedrich Hapke; Michael Reese; Jason Rivers; A. Over; V. Ravikumar; Wilfried Redemund; Andreas Glowatz; Jürgen Schlöffel; Janusz Rajski (ITC, 2012)

Fault collapsing of multi-conditional faults. - Rene Krenz-Baath; Andreas Glowatz; Friedrich Hapke (DDECS, 2013)

Cell-aware experiences in a high-quality automotive test suite. - Friedrich Hapke; Ralf Arnold; Matthias Beck; M. Baby; S. Straehle; J. F. Goncalves; A. Panait; R. Behr; Gwenolé Maugard; A. Prashanthi; Juergen Schloeffel; Wilfried Redemund; et al. (ETS, 2014)

Cell-Aware Test. - Friedrich Hapke; Wilfried Redemund; Andreas Glowatz; Janusz Rajski; Michael Reese; Marek Hustava; Martin Keim; Juergen Schloeffel; Anja Fast (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2014)

DPPM Reduction Methods and New Defect Oriented Test Methods Applied to Advanced FinFET Technologies. - Will Howell; Friedrich Hapke; Edward Brazil; Srikanth Venkataraman; R. Datta; Andreas Glowatz; Wilfried Redemund; J. Schmerberg; Anja Fast; Janusz Rajski (ITC, 2018)

On Modeling CMOS Library Cells for Cell Internal Fault Test Pattern Generation. - Xijiang Lin; Wu-Tung Cheng; Takeo Kobayashi; Andreas Glowatz (ATS, 2021)

Defect-Oriented Test: Effectiveness in High Volume Manufacturing. - Friedrich Hapke; Will Howell; Peter C. Maxwell; Edward Brazil; Srikanth Venkataraman; Rudrajit Dutta; Andreas Glowatz; Anja Fast; Janusz Rajski (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2021)

Affordable and Comprehensive Testing of 3-D Stacked Die Devices. - Jean-François Côté; Jeff Fan; Sean Shen; Givargis Danialy 001; Marcin Lipinski; Michael Garbers; Wu Yang; Martin Keim; Andreas Glowatz; Joe Reynick; Ayush Patel; Joanna Michna (IEEE Des. Test, 2022)

Measuring Non-Redundant VIA Test-Coverage for Automotive Designs in Lower Process Nodes. - Saidapet Ramesh; Rahul Kalyan; Jesse Yanez; Andreas Glowatz; Maija Ryynänen; Sergej Schwarz (ITC, 2023)

A Cell-aware Transistor State Stress Model and its Application for Quality Measurement. - Stephan Eggersglüß; Andreas Glowatz (ITC, 2024)

European Test Symposium Teams: an Anniversary Snapshot. - Maksim Jenihhin; Jaan Raik; Artur Jutman; Natalia Cherezova; Raimund Ubar; Liviu Miclea; Szilárd Enyedi; I. Stefan; Ovidiu Stan; Cosmina Corches; Z. Peng; Petru Eles; et al. (ETS, 2025)