Latent defect detection in microcontroller embedded flash test using device stress and wordline outlier screening. - Andreas Kux; Rudolf Ullmann; Thomas Kern; Roland Strunz; Hanno Melzner; Stephan Beuven; Andreas Haase (ITC, 2014)

Interdisziplinärer Industrie 4.0 Demonstrator (II4D). - Carsten Burmeister; Bonke Möller; Dominik Miller; Andreas Haase; Hendrik Lam (GI-Jahrestagung, 2023)