HTOL SRAM Vmin shift considerations in scaled HKMG technologies. - S. Balasubramanian; Vivek Joshi; Torsten Klick; Randy W. Mann; Joseph Versaggi; Akhilesh Gautam; C. Weintraub; G. Kurz; G. Krause; Andreas Kerber; Biju Parameshwaran; Tanya Nigam (CICC, 2014)

Reliability modeling of HK MG technologies. - Tanya Nigam; Andreas Kerber (CICC, 2014)

Enabling Scaling of Advanced CMOS Technologies: A Reliability Perspective. - Tanya Nigam; Andreas Kerber (ISVLSI, 2015)

Device to circuit reliability correlations for metal gate/high-k transistors in scaled CMOS technologies. - Andreas Kerber (Microelectron. Reliab., 2016)

Material and device innovation impact on reliability for scaled CMOS technologies. - Tanya Nigam; Andreas Kerber; Tian Shen; Rakesh Ranjan; Linjun Cao (ESSDERC, 2017)

Assessment of sense measurement duration on BTI degradation in MG/HK CMOS technologies using a novel stacked transistor test structure. - Andreas Kerber (Microelectron. Reliab., 2017)

Cap layer and multi-work-function tuning impact on TDDB/BTI in SOI FinFET devices. - Wen Liu; Andreas Kerber; Fernando Guarin; Claude Ortolland (IRPS, 2018)

Bias temperature instability in scaled CMOS technologies: A circuit perspective. - Andreas Kerber; Tanya Nigam (Microelectron. Reliab., 2018)