Latent defect detection in microcontroller embedded flash test using device stress and wordline outlier screening. - Andreas Kux; Rudolf Ullmann; Thomas Kern; Roland Strunz; Hanno Melzner; Stephan Beuven; Andreas Haase (ITC, 2014)

28nm Data Memory with Embedded RRAM Technology in Automotive Microcontrollers. - Alessandro Grossi; Matteo Coppetta; Stefano Aresu; Andreas Kux; Thomas Kern; Robert Strenz (IMW, 2023)