Diagnosis of Scan-Chains by Use of a Configurable Signature Register and Error-Correcting Code. - Andreas Leininger; Michael Gössel; Peter Muhmenthaler (DATE, 2004)

A Signature Analysis Technique for the Identification of Failing Vectors with Application to Scan-BIST. - Michael Gössel; Krishnendu Chakrabarty; Vitalij Ocheretnij; Andreas Leininger (J. Electron. Test., 2004)

Evaluating ATE-equipment for volume diagnosis. - Ralf Arnold; Andreas Leininger (ITC, 2005)

Compression mode diagnosis enables high volume monitoring diagnosis flow. - Andreas Leininger; Peter Muhmenthaler; Wu-Tung Cheng; Nagesh Tamarapalli; Wu Yang; Kun-Han Hans Tsai (ITC, 2005)

The Next Step in Volume Scan Diagnosis: Standard Fail Data Format. - Andreas Leininger; Ajay Khoche; Martin Fischer 002; Nagesh Tamarapalli; Wu-Tung Cheng; Randy Klingenberg; Wu Yang (ATS, 2006)

New diagnosis and test methods with high compaction rates. - Andreas Leininger (2006)

Using timing flexibility of automatic test equipment to complement X-tolerant test compression techniques. - Andreas Leininger; Martin Fischer 002; Michael Richter 002; Michael Gössel (ITC, 2007)

Accelerated Shift Registers for X-tolerant Test Data Compaction. - Martin Hilscher; Michael Braun; Michael Richter 002; Andreas Leininger; Michael Gössel (ETS, 2008)

Doubling Test Cell Throughput by On-Loadboard Hardware- Implementation and Experience in a Production Environment. - Frank-Uwe Faber; Matthias Beck; Markus Rudack; Olivier Barondeau; Thomas Rabenalt; Michael Gössel; Andreas Leininger (ETS, 2009)

X-tolerant Test Data Compaction with Accelerated Shift Registers. - Martin Hilscher; Michael Braun; Michael Richter 002; Andreas Leininger; Michael Gössel (J. Electron. Test., 2009)

Masking of X-Values by Use of a Hierarchically Configurable Register. - Thomas Rabenalt; Michael Gössel; Andreas Leininger (J. Electron. Test., 2011)

Improving SRAM test quality by leveraging self-timed circuits. - Josef Kinseher; Leonardo Bonet Zordan; Ilia Polian; Andreas Leininger (DATE, 2016)

Thermal issues in test: An overview of the significant aspects and industrial practice. - Juergen Alt; Paolo Bernardi; Alberto Bosio; Riccardo Cantoro; Hans G. Kerkhoff; Andreas Leininger; Wolfgang Molzer; Alessandro Motta; Christian Pacha; Alberto Pagani; Alireza Rohani; R. Strasser (VTS, 2016)