Broadband Characterization of Materials Using a Dual-Ridged Waveguide. - Milo W. Hyde; Michael J. Havrilla; Andrew E. Bogle; Nathan J. Lehman (IEEE Trans. Instrum. Meas., 2013)

High-Temperature RF Material Characterization Using a Dual-Chambered Rectangular Waveguide Fixture. - Andrew E. Bogle; Milo W. Hyde; Michael J. Havrilla; Jeffrey S. Sovern (IEEE Trans. Instrum. Meas., 2017)