Extending OPMISR beyond 10x Scan Test Efficiency. - Carl Barnhart; Vanessa Brunkhorst; Frank Distler; Owen Farnsworth; Andrew Ferko; Brion L. Keller; David Scott; Bernd Könemann; Takeshi Onodera (IEEE Des. Test Comput., 2002)

Low Overhead Delay Testing of ASICS. - Pamela S. Gillis; Francis Woytowich; Andrew Ferko; Kevin McCauley (ITC, 2004)

An Integrated Framework for At-Speed and ATE-Driven Delay Test of Contract-Manufactured ASICs. - Vikram Iyengar; Kenneth Pichamuthu; Andrew Ferko; Frank Woytowich; David E. Lackey; Gary Grise; Mark Taylor 001; Mike Degregorio; Steven F. Oakland (VTS, 2007)