Rapid method to account for process variation in full-chip capacitance extraction. - Andrew Labun (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2004)

Rapid Detailed Temperature Estimation for Highly Coupled IC Interconnect. - Andrew Labun; Karan Jagjitkumar (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2008)

Extracting interconnect capacitance sensitivity to linewidth variation. - Nick Huang; Andrew Labun (CCECE, 2009)

Including time dependency and ANOVA in decision-making using the revised fuzzy AHP: A case study on wafer fabrication process selection. - Harish C. Rajput; Abbas S. Milani; Andrew Labun (Appl. Soft Comput., 2011)