Modeling and Validation of Fixture-Induced Error for Impedance Measurements. - Blake W. Nelson; Andrew N. Lemmon; Brian T. DeBoi; Todd J. Freeborn (IEEE Trans. Instrum. Meas., 2019)

Experimental Validation of CT-Snubber for Multichip SiC MOSFET Power Module. - Bo Fu 003; Ali Shahabi; Todd J. Freeborn; Andrew N. Lemmon; Mithat C. Kisacikoglu (MWSCAS, 2020)