Mushroom-Type phase change memory with projection liner: An array-level demonstration of conductance drift and noise mitigation. - Robert L. Bruce; Syed Ghazi Sarwat; Irem Boybat; Cheng-Wei Cheng; Wanki Kim; S. R. Nandakumar; Charles Mackin; Timothy Philip; Zuoguang Liu; Kevin Brew; Nanbo Gong; Injo Ok; et al. (IRPS, 2021)

Advanced BEOL Materials, Processes, and Integration to Reduce Line Resistance of Damascene Cu, Co, and Subtractive Ru Interconnects. - Takeshi Nogami; Oleg Gluschenkov; Yasir Sulehria; Son Nguyen; Brown Peethala; Huai Huang; Hosadurga Shobha; Nick A. Lanzillo; Raghuveer Patlolla; Devika Sil; Andrew Simon; Daniel Edelstein; et al. (VLSI Technology and Circuits, 2022)

Impact of Phase-Change Memory Drift on Energy Efficiency and Accuracy of Analog Compute-in-Memory Deep Learning Inference (Invited). - Martin M. Frank; Ning Li; Malte J. Rasch; Shubham Jain; Ching-Tzu Chen; Ramachandran Muralidhar; Jin-Ping Han; Vijay Narayanan; Timothy Philip; Kevin Brew; Andrew Simon; Iqbal Saraf; et al. (IRPS, 2023)