Flash storage integration in the IBM System z EC12 I/O drawer. - Edward W. Chencinski; Michael J. Anderson; Lee Cleveland; Jim Coon; David Craddock; R. E. Galbraith; Thomas A. Gregg; Thomas B. Mathias; D. F. Moertl; K. J. Oakes; M. Sabins; G. E. Sittmann; et al. (IBM J. Res. Dev., 2013)

Using adaptive read voltage thresholds to enhance the reliability of MLC NAND flash memory systems. - Nikolaos Papandreou; Thomas P. Parnell; Haralampos Pozidis; Thomas Mittelholzer; Evangelos Eleftheriou; Charles Camp; Thomas Griffin; Gary A. Tressler; Andrew Walls (ACM Great Lakes Symposium on VLSI, 2014)

Enhancing the Reliability of MLC NAND Flash Memory Systems by Read Channel Optimization. - Nikolaos Papandreou; Thomas P. Parnell; Haralampos Pozidis; Thomas Mittelholzer; Evangelos Eleftheriou; Charles Camp; Thomas Griffin; Gary A. Tressler; Andrew Walls (ACM Trans. Design Autom. Electr. Syst., 2015)

Open Block Characterization and Read Voltage Calibration of 3D QLC NAND Flash. - Nikolaos Papandreou; Haralampos Pozidis; Nikolas Ioannou; Thomas P. Parnell; Roman A. Pletka; Milos Stanisavljevic; Radu Stoica; Sasa Tomic; Patrick Breen; Gary A. Tressler; Aaron Fry; Timothy Fisher; et al. (IRPS, 2020)

Improving NAND flash performance with read heat separation. - Roman A. Pletka; Nikolaos Papandreou; Radu Stoica; Haris Pozidis; Nikolas Ioannou; Tim Fisher; Aaron Fry; Kip Ingram; Andrew Walls (MASCOTS, 2020)