Investigations of impact ionization phenomena in advanced transistors and speed-power improvement of BiMOS SRAM cells based on reverse base current effect. - Alexander N. Bubennikov; Andrey V. Zykov (Microelectron. Reliab., 2001)

High performance computing on fault-prone nanotechnologies: novel microarchitecture techniques exploiting reliability-delay trade-offs. - Andrey V. Zykov; Elias Mizan; Margarida F. Jacome; Gustavo de Veciana; Ajay Subramanian (DAC, 2005)

Exploring Density-Reliability Tradeoffs on Nanoscale Substrates: When do smaller less reliable devices make sense?. - Andrey V. Zykov; Gustavo de Veciana (DFT, 2008)

Using Randomly Assembled Networks for Computation. - Andrey V. Zykov; Gustavo de Veciana (NanoNet, 2008)