Advanced electrical and stability characterization of untrimmed and variously trimmed thick-film and LTCC resistors. - Andrzej Dziedzic; Andrzej Kolek; Waleed Ehrhardt; Heiko Thust (Microelectron. Reliab., 2006)

Evaluation of conductive-to-resistive layers interaction in thick-film resistors. - Krzysztof Mleczko; Zbigniew Zawislak; Adam Witold Stadler; Andrzej Kolek; Andrzej Dziedzic; Jacek Cichosz (Microelectron. Reliab., 2008)