Study of failure mechanism in the modern IGBT with a highly doped N-buffer layer. - Chunlin Zhu; Ian Deviny; Gary Liu; Andy Dai (IECON, 2014)

Reliability enhancement by integrated liquid cooling in power IGBT modules for hybrid and electric vehicles. - Yangang Wang; Steve Jones; Andy Dai; Guoyou Liu (Microelectron. Reliab., 2014)