Modeling Gate-Level Abstraction Hierarchy Using Graph Convolutional Neural Networks to Predict Functional De-Rating Factors. - Aneesh Balakrishnan; Thomas Lange; Maximilien Glorieux; Dan Alexandrescu; Maksim Jenihhin (AHS, 2019)

Challenges of Reliability Assessment and Enhancement in Autonomous Systems. - Maksim Jenihhin; Matteo Sonza Reorda; Aneesh Balakrishnan; Dan Alexandrescu (DFT, 2019)

On the Estimation of Complex Circuits Functional Failure Rate by Machine Learning Techniques. - Thomas Lange; Aneesh Balakrishnan; Maximilien Glorieux; Dan Alexandrescu; Luca Sterpone (DSN (Supplements), 2019)

Machine Learning to Tackle the Challenges of Transient and Soft Errors in Complex Circuits. - Thomas Lange; Aneesh Balakrishnan; Maximilien Glorieux; Dan Alexandrescu; Luca Sterpone (IOLTS, 2019)

The Validation of Graph Model-Based, Gate Level Low-Dimensional Feature Data for Machine Learning Applications. - Aneesh Balakrishnan; Thomas Lange; Maximilien Glorieux; Dan Alexandrescu; Maksim Jenihhin (NORCAS, 2019)

Understanding multidimensional verification: Where functional meets non-functional. - Xinhui Lai; Aneesh Balakrishnan; Thomas Lange; Maksim Jenihhin; Tara Ghasempouri; Jaan Raik; Dan Alexandrescu (Microprocess. Microsystems, 2019)

Enabling Cross-Layer Reliability and Functional Safety Assessment Through ML-Based Compact Models. - Dan Alexandrescu; Aneesh Balakrishnan; Thomas Lange; Maximilien Glorieux (IOLTS, 2020)

Machine Learning Clustering Techniques for Selective Mitigation of Critical Design Features. - Thomas Lange; Aneesh Balakrishnan; Maximilien Glorieux; Dan Alexandrescu; Luca Sterpone (IOLTS, 2020)

Composing Graph Theory and Deep Neural Networks to Evaluate SEU Type Soft Error Effects. - Aneesh Balakrishnan; Thomas Lange; Maximilien Glorieux; Dan Alexandrescu; Maksim Jenihhin (MECO, 2020)

Modeling Soft-Error Reliability Under Variability. - Aneesh Balakrishnan; Guilherme Cardoso Medeiros; Cemil Cem Gürsoy; Said Hamdioui; Maksim Jenihhin; Dan Alexandrescu (DFT, 2021)

Gate-Level Graph Representation Learning: A Step Towards the Improved Stuck-at Faults Analysis. - Aneesh Balakrishnan; Dan Alexandrescu; Maksim Jenihhin; Thomas Lange; Maximilien Glorieux (ISQED, 2021)

On Antagonism Between Side-Channel Security and Soft-Error Reliability in BNN Inference Engines. - Xinhui Lai; Thomas Lange; Aneesh Balakrishnan; Dan Alexandrescu; Maksim Jenihhin (VLSI-SoC, 2021)

On-Chip Aging Sensor Core for Silicon Lifecycle Management. - Fabian Vargas 001; Aneesh Balakrishnan (LATS, 2025)

Accelerate SEU Simulation-Based Fault Injection With Spatio-Temporal Graph Convolutional Networks. - Li Lu; Junchao Chen 001; Aneesh Balakrishnan; Markus Ulbricht 002; Milos Krstic (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2025)