Threshold voltage instabilities in p-channel power VDMOSFETs under pulsed NBT stress. - Ninoslav Stojadinovic; Danijel Dankovic; Ivica Manic; Aneta Prijic; Vojkan Davidovic; Snezana Djoric-Veljkovic; Snezana Golubovic; Zoran Prijic (Microelectron. Reliab., 2010)

NBTI related degradation and lifetime estimation in p-channel power VDMOSFETs under the static and pulsed NBT stress conditions. - Ivica Manic; Danijel Dankovic; Aneta Prijic; Vojkan Davidovic; Snezana Djoric-Veljkovic; Snezana Golubovic; Zoran Prijic; Ninoslav Stojadinovic (Microelectron. Reliab., 2011)

An Electromechanical Approach to a Printed Circuit Board Design Course. - Danijel Dankovic; Ljubomir Vracar; Aneta Prijic; Zoran Prijic (IEEE Trans. Educ., 2013)

A review of pulsed NBTI in P-channel power VDMOSFETs. - Danijel Dankovic; Ivica Manic; Aneta Prijic; Vojkan Davidovic; Zoran Prijic; Snezana Golubovic; Snezana Djoric-Veljkovic; Albena Paskaleva; Dencho Spassov; Ninoslav Stojadinovic (Microelectron. Reliab., 2018)

NBTI and irradiation related degradation mechanisms in power VDMOS transistors. - Ninoslav Stojadinovic; Snezana Djoric-Veljkovic; Vojkan Davidovic; Snezana Golubovic; Srboljub Stankovic; Aneta Prijic; Zoran Prijic; Ivica Manic; Danijel Dankovic (Microelectron. Reliab., 2018)

Response of Commercial P-Channel Power VDMOS Transistors to Ionizing Irradiation and Bias Temperature Stress. - Sandra Veljkovic; Nikola Mitrovic; Vojkan Davidovic; Snezana Golubovic; Snezana Djoric-Veljkovic; Albena Paskaleva; Dencho Spassov; Srboljub Stankovic; Marko S. Andjelkovic; Zoran Prijic; Ivica Manic; Aneta Prijic; et al. (J. Circuits Syst. Comput., 2022)

The Importance of Students' Practical Work in High Schools for Higher Education in Electronic Engineering. - Danijel Dankovic; Milos Marjanovic; Nikola Mitrovic; Emilija Zivanovic; Milan Dankovic; Aneta Prijic; Zoran Prijic (IEEE Trans. Educ., 2023)