40-mm2 3-V-only 50-MHz 64-Mb 2-b/cell CHE NOR flash memory. - Giovanni Campardo; Rino Micheloni; Stefano Commodaro; Emilio Yero; Matteo Zammattio; Sabina Mognoni; Andrea Sacco; Massimiliano Picca; Alessandro Manstretta; Marco Scotti; Ilaria Motta; C. Golla; et al. (IEEE J. Solid State Circuits, 2000)

Introduction to flash memory. - Roberto Bez; Emilio Camerlenghi; Alberto Modelli; Angelo Visconti (Proc. IEEE, 2003)

Soft Errors induced by single heavy ions in Floating Gate memory arrays. - G. Cellere; Alessandro Paccagnella; Angelo Visconti; Mauro Bonanomi (DFT, 2005)

Erratic Effects of Irradiation in Floating Gate Memory Cells. - G. Cellere; Alessandro Paccagnella; Angelo Visconti; Mauro Bonanomi (IOLTS, 2006)

Single Event Effects in 1Gbit 90nm NAND Flash Memories under Operating Conditions. - Marta Bagatin; Giorgio Cellere; Simone Gerardin; Alessandro Paccagnella; Angelo Visconti; Silvia Beltrami; M. Maccarrone (IOLTS, 2007)

Impact of total dose on heavy-ion upsets in floating gate arrays. - Simone Gerardin; Marta Bagatin; Alessandro Paccagnella; G. Cellere; Angelo Visconti; Mauro Bonanomi (Microelectron. Reliab., 2010)

Accelerated reliability testing of flash memory: Accuracy and issues on a 45nm NOR technology. - Marcello Calabrese; Carmine Miccoli; Christian Monzio Compagnoni; Luca Chiavarone; Silvia Beltrami; Andrea Parisi; Sebastiano Bartolone; Andrea L. Lacaita; Alessandro S. Spinelli; Angelo Visconti (ICICDT, 2013)

Cycling-induced threshold-voltage instabilities in nanoscale NAND flash memories: Sensitivity to the array background pattern. - Giovanni M. Paolucci; Massimo Ernesto Bertuccio; Christian Monzio Compagnoni; Silvia Beltrami; Alessandro S. Spinelli; Andrea L. Lacaita; Angelo Visconti (ESSDERC, 2014)

Reviewing the Evolution of the NAND Flash Technology. - Christian Monzio Compagnoni; Akira Goda; Alessandro S. Spinelli; Peter Feeley; Andrea L. Lacaita; Angelo Visconti (Proc. IEEE, 2017)

Comprehensive Reliability Assessment of 32Gb (Hf,Zr)O2-Based Ferroelectric NVDRAM. - Devanarayanan Ettisserry; Angelo Visconti; Mauro Bonanomi; Riccardo Pazzocco; Andrea Locatelli; Alessandro Sebastiani; Ashonita Chavan; Matthew Hollander; Giorgio Servalli; Alessandro Calderoni; Nirmal Ramaswamy (IRPS, 2024)