Thermal noise response based control of tip-sample separation in AFM. - Anil Gannepalli; Abu Sebastian; Jason P. Cleveland; Murti V. Salapaka (ACC, 2004)

The amplitude phase dynamics and fixed points in tapping-mode atomic force microscopy. - Abu Sebastian; Anil Gannepalli; Murti V. Salapaka (ACC, 2004)

A Review of the Systems Approach to the Analysis of Dynamic-Mode Atomic Force Microscopy. - Abu Sebastian; Anil Gannepalli; Murti V. Salapaka (IEEE Trans. Control. Syst. Technol., 2007)