Statistical analysis and parametric yield estimation of standard 6T SRAM cell for different capacities. - Anil Kumar Gundu; Mohammad S. Hashmi; Ramkesh Sharma; Naushad Ansari (SoCC, 2015)

A regression based methodology to estimate SNM for improving yield of 6T SRAM. - Anil Kumar Gundu; Mohammad S. Hashmi; Ramkesh Sharma (MWSCAS, 2016)

A method to estimate effectiveness of weak bit test: Comparison of weak pMOS and WL boost based test - 28nm FDSOI implementation. - Nidhi Batra; Shashwat Kaushik; Anil Kumar Gundu; Mohammad S. Hashmi; G. S. Visweswaran; Anuj Grover (SoCC, 2016)

A high speed low voltage latch type sense amplifier for non-volatile memory. - Disha Arora; Anil Kumar Gundu; Mohammad S. Hashmi (VDAT, 2016)

An effective test methodology enabling detection of weak bits in SRAMs: Case study in 28nm FDSOI. - Nidhi Batra; Anil Kumar Gundu; Mohammad S. Hashmi; G. S. Visweswaran; Anuj Grover (VDAT, 2016)

Modeling and yield estimation of SRAM sub-system for different capacities subjected to parametric variations. - Pulkit Sharma; Anil Kumar Gundu; Mohammad S. Hashmi (VDAT, 2016)

A New Sense Amplifier Topology with Improved Performance for High Speed SRAM Applications. - Anil Kumar Gundu; Mohammad S. Hashmi; Anuj Grover (VLSID, 2016)

Energy Efficient Clock Distribution with Low-Leakage Multi-Vt Buffers. - Anil Kumar Gundu; Volkan Kursun (PATMOS, 2019)

Low Leakage Clock Tree With Dual-Threshold- Voltage Split Input-Output Repeaters. - Anil Kumar Gundu; Volkan Kursun (IEEE Trans. Very Large Scale Integr. Syst., 2019)

Optimization of 3D Stacked Nanosheets in 5nm Gate-all-around Transistor Technology. - Anil Kumar Gundu; Volkan Kursun (SoCC, 2021)

Novel low leakage and energy efficient dual-pullup/dual-pulldown repeater. - Anil Kumar Gundu; Volkan Kursun (Integr., 2021)

Impact of Sheet Width and Silicon Height in 3D Stacked Nanosheet GAA Transistor Technology. - Anil Kumar Gundu; Volkan Kursun (ISCAS, 2022)

E-Textile Battery-Less Walking Step Counting System with <23 pW Power, Dual-Function Harvesting from Breathing, and No High-Voltage CMOS Process. - Anil Kumar Gundu; Luigi Fassio; Massimo Alioto (VLSI Technology and Circuits, 2024)