Hamming count-a compaction testing technique. - Anita Gleason; Wen-Ben Jone (ICCD, 1989)

Reduced Hamming Count and Its Aliasing Probability. - Anita Gleason; Wen-Ben Jone (ICCD, 1991)

Analysis of Hamming count compaction scheme. - Wen-Ben Jone; Anita Gleason (J. Electron. Test., 1991)

PGEN: A Novel Approach to Sequential Circuit Test Generation. - Wen-Ben Jone; Nigam Shah; Anita Gleason; Sunil R. Das (VLSI Design, 1996)