Cell-aware experiences in a high-quality automotive test suite. - Friedrich Hapke; Ralf Arnold; Matthias Beck; M. Baby; S. Straehle; J. F. Goncalves; A. Panait; R. Behr; Gwenolé Maugard; A. Prashanthi; Juergen Schloeffel; Wilfried Redemund; et al. (ETS, 2014)

Cell-Aware Test. - Friedrich Hapke; Wilfried Redemund; Andreas Glowatz; Janusz Rajski; Michael Reese; Marek Hustava; Martin Keim; Juergen Schloeffel; Anja Fast (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2014)

DPPM Reduction Methods and New Defect Oriented Test Methods Applied to Advanced FinFET Technologies. - Will Howell; Friedrich Hapke; Edward Brazil; Srikanth Venkataraman; R. Datta; Andreas Glowatz; Wilfried Redemund; J. Schmerberg; Anja Fast; Janusz Rajski (ITC, 2018)

Defect-Oriented Test: Effectiveness in High Volume Manufacturing. - Friedrich Hapke; Will Howell; Peter C. Maxwell; Edward Brazil; Srikanth Venkataraman; Rudrajit Dutta; Andreas Glowatz; Anja Fast; Janusz Rajski (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2021)