Testability, Debuggability, and Manufacturability Features of the UltraSPARCTM-I Microprocessor. - Marc E. Levitt; Srinivas Nori; Sridhar Narayanan; G. P. Grewal; Lynn Youngs; Anjali Jones; Greg Billus; Siva Paramanandam (ITC, 1995)

Integrating Automated Diagnosis into the Testing and Failure Analysis Operations. - Kenneth M. Butler; Karl Johnson; Jeff Platt; Anjali Jones; Jayashree Saxena (ITC, 1996)