Automated Diagnosis in Testing and Failure Analysis. - Kenneth M. Butler; Karl Johnson; Jeff Platt; Anjali Kinra; Jayashree Saxena (IEEE Des. Test Comput., 1997)

Diagnostic techniques for the UltraSPARC microprocessors. - Anjali Kinra; Aswin Mehta; Neal Smith; Jackie Mitchell; Fred Valente (ITC, 1998)

Towards reducing "functional only" fails for the UltraSPARC microprocessors. - Anjali Kinra (ITC, 1999)

Logic mapping on a microprocessor. - Anjali Kinra; Hari Balachandran; Regy Thomas; John Carulli (ITC, 2000)