A Statistical Wafer Scale Error and Redundancy Analysis Simulator. - Atishay; Ankit Gupta 010; Rashmi Sonawat; Helik Kanti Thacker; Prasanth B (VLSI-SoC (Selected Papers), 2019)

SEARS: A Statistical Error and Redundancy Analysis Simulator. - Atishay; Ankit Gupta 010; Rashmi Sonawat; Helik Kanti Thacker; Prasanth B (VLSI-SoC, 2019)

AlphaRA: An AlphaZero based approach to Redundancy Analysis. - Helik Kanti Thacker; Atishay Kumar; Adrita Barari; Damini; Ankit Gupta 010; Keerthi Kiran Jagannathachar; Deokgu Yoon (ICMLA, 2021)

Identifying Combination of Defects and Unknown Defects on Semiconductor Wafers using Deep Learning and Hierarchical Reclustering. - Ankit Gupta 010; Adrita Barari; Damini; Keerthi Kiran Jagannathachar; Seungwoo Lee; Janghoon Oh; Jungha Kim; Min-Joo Kim (VLSID, 2022)