Physical and Functional Reverse Engineering Challenges for Advanced Semiconductor Solutions. - Bernhard Lippmann; Ann-Christin Bette; Matthias Ludwig 005; Johannes Mutter; Johanna Baehr 001; Alexander Hepp; Horst A. Gieser; Nicola Kovac; Tobias Zweifel; Martin Rasche; Oliver Kellermann (DATE, 2022)

Boundary Enhanced Semantic Segmentation for High Resolution Electron Microscope Images. - Matthias Pollach; Felix Schiegg; Matthias Ludwig 005; Ann-Christin Bette; Alois C. Knoll (EUSIPCO, 2022)

Automated Defect Inspection in Reverse Engineering of Integrated Circuits. - Ann-Christin Bette; Patrick Brus; Gábor Balázs 001; Matthias Ludwig 005; Alois C. Knoll (WACV, 2022)

Counterfeit Detection by Semiconductor Process Technology Inspection. - Matthias Ludwig 005; Ann-Christin Bette; Bernhard Lippmann; Georg Sigl (ETS, 2023)