Hierarchical Identification of Untestable Faults in Sequential Circuits. - Jaan Raik; Raimund Ubar; Anna Krivenko; Margus Kruus (DSD, 2007)

Untestable Fault Identification in Sequential Circuits Using Model-Checking. - Jaan Raik; Hideo Fujiwara; Raimund Ubar; Anna Krivenko (ATS, 2008)

Constraint-based test pattern generation at the Register-Transfer Level. - Taavi Viilukas; Jaan Raik; Maksim Jenihhin; Raimund Ubar; Anna Krivenko (DDECS, 2010)