Ultra sensitive measurement of dielectric current under pulsed stress conditions. - Clemens Helfmeier; Anne Beyreuther; Alexander Fox; Christian Boit (Microelectron. Reliab., 2015)

Assessment of a Chip Backside Protection. - Elham Amini; Anne Beyreuther; Norbert Herfurth; Alexander Steigert; Bernd Szyszka; Christian Boit (J. Hardw. Syst. Secur., 2018)

IC security and quality improvement by protection of chip backside against hardware attacks. - Elham Amini; Anne Beyreuther; Norbert Herfurth; Alexander Steigert; R. Muydinov; Bernd Szyszka; Christian Boit (Microelectron. Reliab., 2018)

Photon emission as a characterization tool for bipolar parasitics in FinFET technology. - Anne Beyreuther; Norbert Herfurth; Elham Amini; Tomonori Nakamura; Ingrid De Wolf; Christian Boit (Microelectron. Reliab., 2018)

New Access to Soft Breakdown Parameters of Low-k Dielectrics Through Localisation-Based Analysis. - Norbert Herfurth; Anne Beyreuther; Elham Amini; Christian Boit; Michél Simon-Najasek; Susanne Hübner; Frank Altmann; R. Herfurth; Chen Wu; Ingrid De Wolf; Kris Croes (IRPS, 2019)