Simultaneous IC-internal voltage and current measurements via a multi lever Scanning Force Microscope. - Claus Hartmann; Rainer Weber; Wolfgang Mertin; Erich Kubalek; Anne-Dorothea Müller; Michael Hietschold (Microelectron. Reliab., 2002)

Double-cantilever device for Atomic Force Microscopy in dynamic noncontact-mode. - Anne-Dorothea Müller; Falk Müller; Jürgen Middeke; Jan Mehner; J. Wibbeler; Thomas Gessner; Michael Hietschold (Microelectron. Reliab., 2002)