Model tests to investigate the effects of geometrical imperfections on the NIST calculable capacitor. - Anne-Marie Jeffery; Lai H. Lee; John Q. Shields (IEEE Trans. Instrum. Meas., 1999)

Characterization of four-terminal-pair resistance standards: a comparison of measurements and theory. - Randolph E. Elmquist; Anne-Marie Jeffery; Dean G. Jarrett (IEEE Trans. Instrum. Meas., 2001)

Improved 1-kHz capacitance calibration uncertainty. - Anne-Marie Jeffery; Andrew D. Koffman (IEEE Trans. Instrum. Meas., 2003)

Nonlinearity of the NIST Calculable Capacitor. - Yicheng Wang; Zhuang Fu; Mathieu Durand; Anne-Marie Jeffery (IEEE Trans. Instrum. Meas., 2019)