Power efficient scan testing by exploiting existing error tolerance circuitry in a design. - Anthi Anastasiou; Yiorgos Tsiatouhas (ETS, 2014)

On the reuse of existing error tolerance circuitry for low power scan testing. - Anthi Anastasiou; Yiorgos Tsiatouhas; Angela Arapoyanni (ISCAS, 2015)