Improvement of signal to noise ratio in electro optical probing technique by wavelets filtering. - Anthony Boscaro; Sabir Jacquir; Kevin Sanchez; Philippe Perdu; Stéphane Binczak (Microelectron. Reliab., 2015)

Automatic process for time-frequency scan of VLSI. - Anthony Boscaro; Sabir Jacquir; Kevin Melendez; Kevin Sanchez; Philippe Perdu; Stéphane Binczak (Microelectron. Reliab., 2016)

Automatic defect localization in VLSI circuits: A fusion approach based on the Dempster-Shafer theory. - Anthony Boscaro; Sabir Jacquir; Kevin Sanchez; Philippe Perdu; Stéphane Binczak (FUSION, 2017)

Pattern image enhancement by automatic focus correction. - Anthony Boscaro; Sabir Jacquir; Kevin Sanchez; Philippe Perdu; Stéphane Binczak (Microelectron. Reliab., 2017)

Automatic localization of signal sources in photon emission images for integrated circuit analysis. - Anthony Boscaro; Sabir Jacquir; Samuel Chef; Kevin Sanchez; Philippe Perdu; Stéphane Binczak (Signal Image Video Process., 2018)