Optimization of analog fault coverage by exploiting defect-specific masking. - Anthony Coyette; Georges G. E. Gielen; Ronny Vanhooren; Wim Dobbelaere (ETS, 2014)

Design and test of analog circuits towards sub-ppm level. - Georges G. E. Gielen; Wim Dobbelaere; Ronny Vanhooren; Anthony Coyette; Baris Esen (ITC, 2014)

Automatic generation of autonomous built-in observability structures for analog circuits. - Anthony Coyette; Baris Esen; Ronny Vanhooren; Wim Dobbelaere; Georges G. E. Gielen (ETS, 2015)

Automated testing of mixed-signal integrated circuits by topology modification. - Anthony Coyette; Baris Esen; Ronny Vanhooren; Wim Dobbelaere; Georges G. E. Gielen (VTS, 2015)

Automatic test signal generation for mixed-signal integrated circuits using circuit partitioning and interval analysis. - Anthony Coyette; Baris Esen; Wim Dobbelaere; Ronny Vanhooren; Georges G. E. Gielen (ITC, 2016)

Analog fault coverage improvement using final-test dynamic part average testing. - Wim Dobbelaere; Ronny Vanhooren; Willy De Man; Koen Matthijs; Anthony Coyette; Baris Esen; Georges G. E. Gielen (ITC, 2016)

Effective DC fault models and testing approach for open defects in analog circuits. - Baris Esen; Anthony Coyette; Georges G. E. Gielen; Wim Dobbelaere; Ronny Vanhooren (ITC, 2016)

Automatic generation of test infrastructures for analog integrated circuits by controllability and observability co-optimization. - Anthony Coyette; Baris Esen; Wim Dobbelaere; Ronny Vanhooren; Georges G. E. Gielen (Integr., 2016)

A very low cost and highly parallel DfT method for analog and mixed-signal circuits. - Baris Esen; Anthony Coyette; Nektar Xama; Wim Dobbelaere; Ronny Vanhooren; Georges G. E. Gielen (ETS, 2017)

Automatic testing of analog ICs for latent defects using topology modification. - Nektar Xama; Anthony Coyette; Baris Esen; Wim Dobbelaere; Ronny Vanhooren; Georges G. E. Gielen (ETS, 2017)

Non-intrusive detection of defects in mixed-signal integrated circuits using light activation. - Baris Esen; Anthony Coyette; Nektar Xama; Wim Dobbelaere; Ronny Vanhooren; Georges G. E. Gielen (ITC, 2017)

Methodology Towards Sub-ppm Testing of Analog and Mixed-Signal ICs for Cyber-Physical Systems. - Georges G. E. Gielen; Baris Esen; Wim Dobbelaere; Ronny Vanhooren; Anthony Coyette; Nektar Xama (ISCAS, 2018)

ADAGE: Automatic DfT-Assisted Generation of Test Stimuli for Mixed- Signal Integrated Circuits. - Anthony Coyette; Baris Esen; Nektar Xama; Georges G. E. Gielen; Wim Dobbelaere; Ronny Vanhooren (IEEE Des. Test, 2018)

An Automated Low-Cost Analog and Mixed-Signal DfT Method Using Testing Diodes. - Baris Esen; Anthony Coyette; Nektar Xama; Georges G. E. Gielen; Wim Dobbelaere; Ronny Vanhooren (IEEE Des. Test, 2018)

Applying Vstress and defect activation coverage to produce zero-defect mixed-signal automotive ICs. - Wim Dobbelaere; Frederik Colle; Anthony Coyette; Ronny Vanhooren; Nektar Xama; Jhon Gomez; Georges G. E. Gielen (ITC, 2019)

Latent Defect Screening with Visually-Enhanced Dynamic Part Average Testing. - Anthony Coyette; Wim Dobbelaere; Ronny Vanhooren; Nektar Xama; Jhon Gomez; Georges G. E. Gielen (ETS, 2020)

Avoiding Mixed-Signal Field Returns by Outlier Detection of Hard-to-Detect Defects based on Multivariate Statistics. - Nektar Xama; Jakob Raymaekers; Martin Andraud; Jhon Gomez; Wim Dobbelaere; Ronny Vanhooren; Anthony Coyette; Georges G. E. Gielen (ETS, 2020)

Quick Analyses for Improving Reliability and Functional Safety of Mixed-Signal ICs. - Stephen Sunter; Michal Wolinski; Anthony Coyette; Ronny Vanhooren; Wim Dobbelaere; Nektar Xama; Jhon Gomez; Georges G. E. Gielen (ITC, 2020)

Pinhole Latent Defect Modeling and Simulation for Defect-Oriented Analog/Mixed-Signal Testing. - Jhon Gomez; Nektar Xama; Anthony Coyette; Ronny Vanhooren; Wim Dobbelaere; Georges G. E. Gielen (VTS, 2020)

Machine Learning-based Defect Coverage Boosting of Analog Circuits under Measurement Variations. - Nektar Xama; Martin Andraud; Jhon Gomez; Baris Esen; Wim Dobbelaere; Ronny Vanhooren; Anthony Coyette; Georges G. E. Gielen (ACM Trans. Design Autom. Electr. Syst., 2020)

Recent Trends and Perspectives on Defect-Oriented Testing. - Paolo Bernardi; Riccardo Cantoro; Anthony Coyette; W. Dobbeleare; Moritz Fieback; Andrea Floridia; G. Gielenk; Jhon Gomez; Michelangelo Grosso; Andrea Guerriero; Iacopo Guglielminetti; Said Hamdioui; et al. (IOLTS, 2022)

DDtM: Increasing Latent Defect Detection in Analog/Mixed-Signal ICs Using the Difference in Distance to Mean Value. - Jhon Gomez; Nektar Xama; Anthony Coyette; Ronny Vanhooren; Wim Dobbelaere; Georges G. E. Gielen (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022)

High-coverage analog IP block test generation methodology using low-cost signal generation and output response analysis. - Jhon Gomez; Nektar Xama; Anthony Coyette; Ronny Vanhooren; Wim Dobbelaere; Georges G. E. Gielen (ETS, 2023)

Boosting Latent Defect Coverage in Automotive Mixed-Signal ICs Using SVM Classifiers. - Nektar Xama; Jhon Gomez; Wim Dobbelaere; Ronny Vanhooren; Anthony Coyette; Georges G. E. Gielen (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2023)

European Test Symposium Teams: an Anniversary Snapshot. - Maksim Jenihhin; Jaan Raik; Artur Jutman; Natalia Cherezova; Raimund Ubar; Liviu Miclea; Szilárd Enyedi; I. Stefan; Ovidiu Stan; Cosmina Corches; Z. Peng; Petru Eles; et al. (ETS, 2025)