Ultimate: A hardware logic simulation engine. - M. E. Glazier; Anthony P. Ambler (DAC, 1984)

An Analysis of the Economics of Self Test. - Prab Varma; Anthony P. Ambler; Keith Baker (ITC, 1984)

Economically Viable Automatic Insertion of Self-Test Features for Custom VLSI. - Mark Paraskeva; Anthony P. Ambler; D. F. Burrows; W. L. Knight; I. D. Dear (ITC, 1986)

Estimation of area and performance overheads for testable VLSI circuits. - J. R. Miles; Anthony P. Ambler; K. A. E. Totton (ICCD, 1988)

Cost Analysis of Test Method Environments. - Chryssa Dislis; I. D. Dear; J. R. Miles; S. C. Lau; Anthony P. Ambler (ITC, 1989)

Economic Effects in Design and Test. - I. D. Dear; Chryssa Dislis; Anthony P. Ambler; J. H. Dick (IEEE Des. Test Comput., 1991)

A Steady-State Response Test Generation for Mixed-Signal Integrated Circuits. - Alaa F. Alani; Gerry Musgrave; Anthony P. Ambler (ITC, 1992)

Economics in Design and Test. - Chryssa Dislis; Anthony P. Ambler; I. D. Dear; J. H. Dick (ICCD, 1993)

Algorithms for Cost Optimised Test Strategy Selection. - Chryssa Dislis; J. H. Dick; Anthony P. Ambler (ITC, 1993)

Economics Modelling for the Determination of Test Strategies for Complex VLSI Boards. - Chryssa Dislis; J. H. Dick; I. D. Dear; I. N. Azu; Anthony P. Ambler (ITC, 1993)

The application and use of boundary scan: Bleeker, H, van den Eijnden, P and de Jong, FBoundary-scan test - a practical approach Kluwer Academic (1992) ISBN 0 7923 9296 5, £50.75, pp 222. - Anthony P. Ambler (Microprocess. Microsystems, 1993)

System Test Cost Modelling Based on Event Rate Analysis. - Des Farren; Anthony P. Ambler (ITC, 1994)

Test strategy planning using economic analysis. - I. D. Dear; Chryssa Dislis; Anthony P. Ambler; J. H. Dick (J. Electron. Test., 1994)

Sensitivity analysis in economics based test strategy planning. - J. H. Dick; Erwin Trischler; Chryssa Dislis; Anthony P. Ambler (J. Electron. Test., 1994)

Cost-Effective System-Level Test Strategies. - Des Farren; Anthony P. Ambler (ITC, 1995)

The Economics of System-Level Testing. - Des Farren; Anthony P. Ambler (IEEE Des. Test Comput., 1997)

From DFT to systems test - a model based cost optimization tool. - Michael G. Wahl; Anthony P. Ambler; Christoph Maaß; Mohammed Rahman (DATE, 2001)

Is It Rocket Science? - Anthony P. Ambler (ITC, 2002)

System Manufacturing Test Cost Model. - David Williams; Anthony P. Ambler (ITC, 2002)

Using the Nonlinear Property of FSR and Dictionary Coding for Reduction of Test Volume. - Il-soo Lee; Jae-Hoon Jeong; Anthony P. Ambler (ISVLSI, 2005)

Reduction of Power and Test Time by Removing Cluster of Don't-Care from Test Data Set. - Il-soo Lee; Yu-Ting Lin 004; Anthony P. Ambler (ISVLSI, 2005)

Design Trade-Offs and Power Reduction Techniques for High Performance Circuits and System. - Taikyeong T. Jeong; Anthony P. Ambler (ICCSA (5), 2006)

Behavioral Test Economics. - Scott Davidson 001; Anthony P. Ambler; Helen Davidson (ITC, 2006)

A HW/SW Co-design Methodology: An Accurate Power Efficiency Model and Design Metrics for Embedded System. - Lftikhar Khan; Taikyeong T. Jeong; Gyung-Leen Park; Anthony P. Ambler (SNPD, 2009)