Intrinsic NBTI-variability aware statistical pipeline performance assessment and tuning. - Balaji Vaidyanathan; Anthony S. Oates; Yuan Xie 001 (ICCAD, 2009)

NBTI-aware statistical circuit delay assessment. - Balaji Vaidyanathan; Anthony S. Oates; Yuan Xie 001; Yu Wang 002 (ISQED, 2009)

Circuit-aware device reliability criteria methodology. - Jason T. Ryan; Lan Wei; Jason P. Campbell; Ricki G. Southwick; Kin P. Cheung; Anthony S. Oates; H.-S. Philip Wong; John Suehle (ESSCIRC, 2011)

Reliability challenges for the continued scaling of IC technologies. - Anthony S. Oates (CICC, 2012)

Will reliability limit Moore's law? - Anthony S. Oates (VLSI-DAT, 2014)

Soft errors in 7nm FinFET SRAMs with integrated fan-out packaging. - Yi-Pin Fang; Anthony S. Oates (IRPS, 2018)