High fluence 1.8 MeV proton irradiation effects on n-type MOS capacitors. - R. Arinero; En-xia Zhang; Nadia Rezzak; Ronald D. Schrimpf; Daniel M. Fleetwood; B. K. Choï; A. B. Hmelo; Julien Mekki; Antoine D. Touboul; Frédéric Saigné (Microelectron. Reliab., 2011)

Evaluation of test algorithms stress effect on SRAMs under neutron radiation. - Georgios Tsiligiannis; Luigi Dilillo; Alberto Bosio; Patrick Girard 001; Aida Todri; Arnaud Virazel; Antoine D. Touboul; Frederic Wrobel; Frédéric Saigné (IOLTS, 2012)

On the reliability assessment of trench fieldstop IGBT under atmospheric neutron spectrum. - Antoine D. Touboul; L. Foro; Frederic Wrobel; Frédéric Saigné (Microelectron. Reliab., 2012)

Transient device simulation of neutron-induced failure in IGBT: A first step for developing a compact predictive model. - K. Guetarni; Antoine D. Touboul; Jerome Boch; L. Foro; A. Privat; Alain Michez; J.-R. Vaillé; Frédéric Saigné (Microelectron. Reliab., 2013)

Modeling dose effects in electronics devices: Dose and temperature dependence of power MOSFET. - Alain Michez; Jerome Boch; S. Dhombres; Frédéric Saigné; Antoine D. Touboul; J.-R. Vaillé; Laurent Dusseau; E. Lorfèvre; R. Ecoffet (Microelectron. Reliab., 2013)

A calculation method to estimate single event upset cross section. - Frederic Wrobel; Antoine D. Touboul; Vincent Pouget; Luigi Dilillo; Jerome Boch; Frédéric Saigné (Microelectron. Reliab., 2017)

Analysis of the charge sharing effect in the SET sensitivity of bulk 45 nm standard cell layouts under heavy ions. - Ygor Q. Aguiar; Frederic Wrobel; Jean-Luc Autran; Paul Leroux; Frédéric Saigné; Antoine D. Touboul; Vincent Pouget (Microelectron. Reliab., 2018)

Effect of Temperature on Single Event Latchup Sensitivity. - S. Guagliardo; Frederic Wrobel; Ygor Q. Aguiar; Jean-Luc Autran; Paul Leroux; Frédéric Saigné; Vincent Pouget; Antoine D. Touboul (DTIS, 2020)

Evaluation and Analysis of Technologies for Robotic Platforms for the Nuclear Decommissioning. - Georgios Tsiligiannis; Antoine D. Touboul; Gaëtan Bricas; Tadec Maraine; Jerome Boch; Frederic Wrobel; Alain Michez; Frédéric Saigné; Alain Godot; Asenath Etile; Thibaud Durand; Romain Sueur; et al. (DTIS, 2020)

Development and evaluation of a flexible instrumentation layer for system-level testing of radiation effects. - Israel C. Lopes; Vincent Pouget; Frederic Wrobel; Frédéric Saigné; Antoine D. Touboul; Ketil Røed (LATS, 2020)