Nitrogen-Vacancy centers in diamond for current imaging at the redistributive layer level of Integrated Circuits. - Antoine Nowodzinski; Mayeul Chipaux; Loïc Toraille; Vincent Jacques; Jean-François Roch; Thierry Debuisschert (Microelectron. Reliab., 2015)

1/f Noise Characterization of Piezoresistive Nano-Gauges for MEMS Sensors. - Antoine Nowodzinski; Dihia Sidi Ahmed; Christoforos G. Theodorou; Alexandra Kournela; Hélène Duchemin; Cyril Dressler; Audrey Berthelot; Hélène Lhermer (IEEE SENSORS, 2018)