Dynamic study of the thermal laser stimulation response on advanced technology structures. - Antoine Reverdy; M. de la Bardonnie; Patrick Poirier; H. Murray; Philippe Perdu; A. Boukkali (Microelectron. Reliab., 2008)

Fast and rigorous use of thermal time constant to characterize back end of the line test structure in advanced technology. - Antoine Reverdy; Philippe Perdu; H. Murray; M. de la Bardonnie; Patrick Poirier (Microelectron. Reliab., 2008)

Facing the defect characterization and localization challenges of bridge defects on a submicronic technology (45 nm and below). - Guillaume Celi; Sylvain Dudit; Philippe Perdu; Antoine Reverdy; Thierry Parrassin; Emmanuel Bechet; Dean Lewis; Michel Vallet (Microelectron. Reliab., 2010)

LVI detection on passive structure in advance CMOS technology: New opportunities for device analysis. - Guillaume Celi; Sylvain Dudit; Thierry Parrassin; Philippe Perdu; Antoine Reverdy; Dean Lewis; Michel Vallet (Microelectron. Reliab., 2011)

Electro Optical Terahertz Pulse Reflectometry, a non destructive technique to localize defects on various type of package. - Antoine Reverdy; M. Marchetti; Allesandra Fudoli; Alberto Pagani; V. Goubier; M. Cason; Jesse Alton; Martin Igarashi; G. Gibbons (Microelectron. Reliab., 2014)

Exploitation of Laser Voltage techniques for identification and complete characterization of a scan chain transition fail issue using the second harmonic approach. - Emanuele Villa; Audrey Garnier; Antoine Reverdy (Microelectron. Reliab., 2018)