Current Testing Procedure for Deep Submicron Devices. - Anton Chichkov; Dirk Merlier; Peter Cox (J. Electron. Test., 2001)

Comparison of different test strategies on a mixed-signal circuit. - Juraj Brenkus; Viera Stopjaková; Ronny Vanhooren; Anton Chichkov (DDECS, 2009)

Challenges for test and design for test. - Anton Chichkov (DDECS, 2009)