On estimating bounds of the quiescent current for IDDQ testin. - Antoni Ferré; Joan Figueras (VTS, 1996)

IDDQ Characterization in Submicron CMOS. - Antoni Ferré; Joan Figueras (ITC, 1997)

Characterization of leakage power in CMOS technologies. - Antoni Ferré; Joan Figueras (ICECS, 1998)

IDDQ testing: state of the art and future trends. - Antoni Ferré; Eugeni Isern 001; Josep Rius 001; Rosa Rodríguez-Montañés; Joan Figueras (Integr., 1998)

LEAP: An Accurate Defect-Free IDDQ Estimator. - Antoni Ferré; Joan Figueras (J. Electron. Test., 2001)

Leakage power bounds in CMOS digital technologies. - Antoni Ferré; Joan Figueras (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2002)