Advances in scanning SQUID microscopy for die-level and package-level fault isolation. - Lee A. Knauss; Antonio Orozco; Solomon I. Woods; Alfred B. Cawthorne (Microelectron. Reliab., 2003)

Magnetic Field Imaging for non destructive 3D IC testing. - Jan Gaudestad; Antonio Orozco (Microelectron. Reliab., 2014)

Short localization in CPU FlipChip using thermal imaging and magnetic current imaging: Advanced fault isolation technique comparison. - Jan Gaudestad; Antonio Orozco; Jack Chen (IRPS, 2015)