Reliability analysis of power gated SRAM under combined effects of NBTI and PBTI in nano-scale CMOS. - Anuj Pushkarna; Hamid Mahmoodi (ACM Great Lakes Symposium on VLSI, 2010)

Comparison of performance parameters of SRAM designs in 16nm CMOS and CNTFET technologies. - Anuj Pushkarna; Sajna Raghavan; Hamid Mahmoodi (SoCC, 2010)