Measurement of BTI-induced Threshold Voltage Shift for Power MOSFETs under Switching Operation. - Aoi Ueda; Michihiro Shintani; Michiko Inoue; Takashi Sato 001 (ATS, 2020)

Accelerating Parameter Extraction of Power MOSFET Models Using Automatic Differentiation. - Michihiro Shintani; Aoi Ueda; Takashi Sato 001 (CoRR, 2021)