Analysis and Modeling of Stress over Layer Induced Threshold Voltage Shift in HKMG nMOS Transistors. - Apoorva Ojha; Narendra Parihar; Nihar R. Mohapatra (VLSID, 2016)

Trap-assisted carrier transport through the multi-stack gate dielectrics of HKMG nMOS transistors: A compact model. - Apoorva Ojha; Nihar R. Mohapatra (ESSDERC, 2017)